Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11881647
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Filing Dt:
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07/27/2007
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Publication #:
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Pub Dt:
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07/03/2008
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Inventor:
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Ji Ho Hong
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Title:
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TEG pattern and method for testing semiconductor device using the same
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 891-10, DAECHI-DONG, GANGNAM-GU |
| SEOUL, KOREA, REPUBLIC OF 135-280 |
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| ANDREW D. FORTNEY, PH.D. |
| LAW OFFICE OF ANDREW D.FORTNEY,PH.D., PC |
| 401 W. FALLBROOK AVE. |
| SUITE 204 |
| FRESNO, CA 93711 |
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