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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
12072196
Filing Dt:
02/25/2008
Publication #:
Pub Dt:
08/28/2008
Inventors:
Rene Schenck, Ralf Friedrich, Thomas Iffland, Daniel Skiera
Title:
Method of determining geometric parameters of a wafer
Assignment: 1
Reel/Frame:
020618/0138Recorded: 02/25/2008Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/15/2008
Exec Dt:
02/14/2008
Exec Dt:
02/15/2008
Exec Dt:
02/14/2008
Assignee:
KUBACHER WEG 4
WEILBURG, GERMANY 35781
Correspondent:
WILLIAM C. GEHRIS
DAVIDSON DAVIDSON & KAPPEL, LLC
485 SEVENTH AVENUE
14TH FLOOR
NEW YORK, NY 10018

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