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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
7714999
Issue Dt:
05/11/2010
Application #:
11952010
Filing Dt:
12/06/2007
Publication #:
20080231845
Pub Dt:
09/25/2008
Inventors:
Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
Title:
HIGH RESOLUTION WAFER INSPECTION SYSTEM
Assignment: 1
Reel/Frame:
021071/0390Recorded: 06/10/2008Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
GROSSMAN, DAN
Exec Dt:
03/03/2008
LANGER, MOSHE
Exec Dt:
03/08/2008
KRIS, ROMAN
Exec Dt:
03/03/2008
REINHORN, SILVIU
Exec Dt:
03/03/2008
NAFTALI, RON
Exec Dt:
03/18/2008
FELDMAN, HAIM
Exec Dt:
02/10/2008
Assignee:
APPLIED MATERIALS ISRAEL, LTD.
P.O. BOX 061080
WACKER DRIVE STATION, SEARS TOWER
CHICAGO, ILLINOIS 60606
Correspondent:
APPLIED MATERIALS, INC. C/O SONNENSCHEIN
P.O. BOX 061080
WACKER DRIVE STATION, SEARS TOWER
CHICAGO, IL 60606-1080

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