Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/08/2009
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Application #:
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11807235
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Filing Dt:
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05/25/2007
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Publication #:
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Pub Dt:
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11/27/2008
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Inventors:
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Roy Mallory, Jaydeep Kumar Sinha, Stephen MacLeod
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Title:
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WAFER EDGE-DEFECT DETECTION AND CAPACITIVE PROBE THEREFOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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WEINGARTEN, SCHURGIN, GAGNEBIN & |
LEBOVICI, LLP |
TEN POST OFFICE SQUARE |
BOSTON, MASSACHUSETTS 02109 |
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