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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/15/2010
Application #:
11967729
Filing Dt:
12/31/2007
Publication #:
Pub Dt:
01/01/2009
Inventors:
Ki-Ho KIM, Ji-Eun JANG
Title:
PROBE-TESTING DEVICE AND METHOD OF SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
020413/0914Recorded: 01/07/2008Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/24/2007
Exec Dt:
12/24/2007
Assignee:
SAN 136-1, AMI-RI BUBAL-EUB
ICHON-SHI, KYOUNGKI-DO, KOREA, REPUBLIC OF 467-860
Correspondent:
STEVEN M. RABIN
RABIN & BERDO, PC
1101 14TH STREET, N.W., SUITE 500
WASHINGTON, D.C. 20005

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