Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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03/19/2013
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Application #:
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11888827
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Filing Dt:
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08/02/2007
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Publication #:
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Pub Dt:
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02/05/2009
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Inventors:
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Ajharali Amanullah, Lin Jing, Chunlin Luke Zeng
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Title:
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PATTERNED WAFER DEFECT INSPECTION SYSTEM AND METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| BLK 25 KALLANG AVENUE #06-01 |
| KALLANG BASIN INDUSTRIAL ESTATE |
| SINGAPORE, SINGAPORE 339416 |
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| CHRISTOPHER J. ROURK |
| JACKSON WALKER L.L.P. |
| 901 MAIN STREET, SUITE 6000 |
| DALLAS, TX 75202 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| BLK. 25, KALLANG AVENUE #04-01 |
| KALLANG BASIN INDUSTRIAL ESTATE |
| SINGAPORE, SINGAPORE 339416 |
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| HORIZON IP PTE LTD |
| 7500A BEACH ROAD |
| #04-306/308 THE PLAZA |
| SINGAPORE, 199591 SINGAPORE |
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