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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/29/2010
Application #:
11837220
Filing Dt:
08/10/2007
Publication #:
Pub Dt:
02/12/2009
Inventors:
Azmi Kadkly, Stephen Biellak, Mehdi Vaez-Iravani
Title:
SYSTEMS CONFIGURED TO INSPECT A WAFER
Assignment: 1
Reel/Frame:
019980/0659Recorded: 10/18/2007Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/04/2007
Exec Dt:
10/16/2007
Exec Dt:
10/16/2007
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
BAKER & MCKENZIE LLP
1114 AVENUE OF THE AMERICAS
NEW YORK, NY 10036

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