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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/11/2010
Application #:
11853615
Filing Dt:
09/11/2007
Publication #:
Pub Dt:
03/12/2009
Inventors:
Garrett John Long, Saju Francis Olakengil, Pramod Gaud, John Jacob Roberts
Title:
INTELLIGENT INSPECTION BASED ON TEST CHIP PROBE FAILURE MAPS
Assignment: 1
Reel/Frame:
019811/0747Recorded: 09/11/2007Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/10/2007
Exec Dt:
08/29/2007
Exec Dt:
08/31/2007
Exec Dt:
08/31/2007
Assignee:
160 RIO ROBLES
SAN JOSE, CALIFORNIA 95134
Correspondent:
JOSHUA D. ISENBERG
809 CORPORATE WAY
FREMONT, CA 94539

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