Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/10/2013
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Application #:
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12323025
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Filing Dt:
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11/25/2008
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Publication #:
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Pub Dt:
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07/02/2009
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Inventors:
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Brian Douglas Reid, James David Bernstein, Mark Boehm, Howie Hui Yang, Hongyu Yue
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Title:
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CONTROL OF IMPLANT PATTERN CRITICAL DIMENSIONS USING STI STEP HEIGHT OFFSET
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7839 CHURCHILL WAY, M/S 3999 |
| DALLAS, TEXAS 75251 |
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| JAMES BRADY, ESQ. |
| TEXAS INSTRUMENTS INCORPORATED |
| 7839 CHURCHILL WAY, M/S 3999 |
| DALLAS, TEXAS 75251 |
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