Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12480443
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Filing Dt:
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06/08/2009
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Publication #:
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Pub Dt:
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12/17/2009
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Inventors:
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Yasuhiro GUNJI, Akira Fujii, Hiroyuki Takahashi, Ryuichi Funatsu, Toshifumi Honda et al
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Title:
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APPARATUS FOR INSPECTING A SUBSTRATE, A METHOD OF INSPECTING A SUBSTRATE, A SCANNING ELECTRON MICROSCOPE, AND A METHOD OF PRODUCING AN IMAGE USING A SCANNING ELECTRON MICROSCOPE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-24-14, NISHI SHINBASHI, MINATO-KU, |
TOKYO, JAPAN |
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MCDERMOTT WILL & EMERY LLP |
600 13TH STREET, N.W. |
WASHINGTON, DC 20005-3096 |
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