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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/06/2012
Application #:
12301467
Filing Dt:
11/19/2008
Publication #:
Pub Dt:
12/24/2009
Inventor:
Yoshiyuki Hanada
Title:
DEFECT DISTRIBUTION PATTERN COMPARISON METHOD AND SYSTEM
Assignment: 1
Reel/Frame:
021888/0290Recorded: 11/25/2008Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/22/2008
Assignee:
AKASAKA BIZ TOWER, 3-1, AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-6325
Correspondent:
OBLON, SPIVAK, ET AL.
1940 DUKE STREET
ALEXANDRIA, VA 22314

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