Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12548114
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Filing Dt:
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08/26/2009
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Publication #:
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Pub Dt:
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02/04/2010
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Inventors:
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Heui Jae PARK, Heung Hyun SHIN, Il Hwan LEE
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Title:
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DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| #201 DONG-A TOWN, 1629-2 |
| BONG-CHUN 7-DONG,GWANAK-GU |
| SEOUL, KOREA, REPUBLIC OF 152-818 |
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| YONG BEOM HWANG |
| VOLPE AND KOENIG, P.C. |
| 30 S. 17TH ST., UNITED PLAZA, 18TH FLOOR |
| PHILADELPHIA, PA 19103 |
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