Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/14/2012
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Application #:
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12777858
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Filing Dt:
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05/11/2010
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Publication #:
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Pub Dt:
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09/02/2010
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Inventors:
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Ming-Hsiu Lee, Chao-I Wu, Ming-Chang Kuo
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Title:
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TEST STRUCTURE AND METHOD FOR DETECTING CHARGE EFFECTS DURING SEMICONDUCTOR PROCESSING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 16, LI-HSIN ROAD |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN |
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| BAKER & MCKENZIE LLP PATENT DEPARTMENT |
| 2001 ROSS AVENUE |
| SUITE 2300 |
| DALLAS, TX 75201 |
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