Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12728582
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Filing Dt:
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03/22/2010
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Publication #:
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Pub Dt:
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09/30/2010
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Inventors:
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Torsten Fahr, Matthias Schaller, Wolfgang Buchholtz
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Title:
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METHOD AND SYSTEM FOR MATERIAL CHARACTERIZATION IN SEMICONDUCTOR PRODUCTION PROCESSES BASED ON FTIR WITH VARIABLE ANGLE OF INCIDENCE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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PO BOX 309, UGLAND HOUSE |
GRAND CAYMAN, CAYMAN ISLANDS KY1-1194 |
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J. MIKE AMERSON |
10333 RICHMOND, SUITE 1100 |
HOUSTON, TX 77042 |
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Assignment:
2
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RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS).
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440 STONE BREAK ROAD EXTENSION |
MALTA, NEW YORK 12020 |
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BENJAMIN PETERSEN |
1460 EL CAMINO REAL, 2ND FLOOR |
SHEARMAN & STERLING LLP |
MENLO PARK, CA 94025 |
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