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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
12906726
Filing Dt:
10/18/2010
Publication #:
Pub Dt:
03/17/2011
Inventor:
Klaus KRAEMER
Title:
METHOD AND APPARATUS FOR NON-DESTRUCTIVE DETECTION OF DEFECTS IN THE INTERIOR OF SEMICONDUCTOR MATERIAL
Assignment: 1
Reel/Frame:
025487/0978Recorded: 12/14/2010Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/08/2010
Assignee:
LERCHENWEG 16
HERBORN, GERMANY 35745
Correspondent:
MARIA M. ELISEEVA
HOUSTON ELISEEVA LLP
420 BEDFORD ST., SUITE 155
LEXINGTON, MA 02420

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