Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/28/2012
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Application #:
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12631221
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Filing Dt:
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12/04/2009
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Publication #:
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Pub Dt:
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06/09/2011
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Inventors:
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Charles Nickel, David Lidsky, Seth Kahn
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Title:
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INTEGRATED ELECTRICAL CIRCUIT AND TEST TO DETERMINE THE INTEGRITY OF A SILICON DIE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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47467 FREMONT BOULEVARD |
FREMONT, CALIFORNIA 94538-6537 |
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JOSEPH M. VILLENEUVE |
500 12TH STREET |
SUITE 200 |
OAKLAND, CA 94607 |
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