Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/22/2013
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Application #:
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12766774
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Filing Dt:
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04/23/2010
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Publication #:
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Pub Dt:
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10/27/2011
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Inventors:
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Shyh-Shyan Liao, Ying-Che Lo, Albert C. Sun
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Title:
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INTEGRATED CIRCUIT DEVICE TEST APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| RM. 209, BLDG. 53, 195, SEC. 4 |
| CHUNG HSING ROAD, CHUTUNG |
| HSINCHU, TAIWAN 31040 |
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| HAYNES BEFFEL & WOLFELD LLP |
| P O BOX 366 |
| MARK A. HAYNES |
| HALF MOON BAY, CA 94019 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.8, LI-HSIN ROAD. 6, SCIENCE-BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN 300-77 |
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| MCCLURE, QUALEY & RODACK, LLP |
| 3100 INTERSTATE NORTH CIRCLE |
| SUITE 150 |
| ATLANTA, GA 30339 |
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