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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/23/2013
Application #:
12681722
Filing Dt:
04/05/2010
Publication #:
Pub Dt:
11/03/2011
Inventor:
Sok Leng Chan
Title:
APPARATUS FOR DETECTING MICRO-CRACKS IN WAFERS AND METHOD THEREFOR
Assignment: 1
Reel/Frame:
024187/0396Recorded: 04/05/2010Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/12/2010
Assignee:
1 BUKIT BATOK CRESCENT, #09-48
WCEGA PLAZA
SINGAPORE, SINGAPORE 658064
Correspondent:
NIELDS, LEMACK & FRAME, LLC
176 E. MAIN STREET
SUITE #5
WESTBOROUGH, MA 01581
Assignment: 2
Reel/Frame:
044401/0715Recorded: 12/14/2017Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/08/2017
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
PATTERSON & SHERIDAN, L.L.P.
24 GREENWAY PLAZA, SUITE 1600
HOUSTON, TX 77046

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