Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/17/2013
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Application #:
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13165823
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Filing Dt:
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06/22/2011
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Publication #:
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Pub Dt:
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01/05/2012
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Inventors:
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Byoungsul KIM, Hakyong Lee, Jun-Ho Jo, Kyu-Min Park
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Title:
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TEST MODE CONTROL CIRCUIT IN SEMICONDUCTOR MEMORY DEVICE AND TEST MODE ENTERING METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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416, MAETAN-DONG, YEONGTONG-GU |
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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EUGENE M. LEE |
3141 FAIRVIEW PARK DRIVE |
SUITE 500 |
FALLS CHURCH, VA 22042 |
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