Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13145933
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Filing Dt:
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10/11/2011
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Publication #:
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Pub Dt:
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02/02/2012
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Inventors:
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Vollmar Wilfried, Frank Stubhan
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Title:
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ARRANGEMENT AND METHOD FOR MEASUREMENT OF THE TEMPERATURE AND OF THE THICKNESS GROWTH OF SILICON RODS IN A SILICON DEPOSITION REACTOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| JOHANNES-SCHMID-STRASSE 8 |
| BLAUBEUREN, GERMANY 89143 |
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| JEFF ROTHENBERG |
| 5 COLUMBIA CIRCLE |
| HESLIN ROTHENBERG FARLEY & MESITI P.C. |
| ALBANY, NY 12203 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| GEWERBEPARK LINDACH A 12 |
| BURGHAUSEN, GERMANY 84489 |
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| JEFF ROTHENBERG, ESQ. |
| 5 COLUMBIA CIRCLE |
| HESLIN ROTHENBERG FARLEY & MESITI P.C. |
| ALBANY, NY 12203 |
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