Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13028692
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Filing Dt:
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02/16/2011
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Publication #:
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Pub Dt:
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02/23/2012
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Inventors:
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Yen-Chun CHOU, Cheng-Kai Chen, Jen-Ming Chang, Yu-Hsi Lee, Che-Min Lin
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Title:
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APPARATUS AND METHOD FOR INSPECTING INTERNAL DEFECT OF SUBSTRATE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 31-1, SHIEN PAN ROAD, KUEI SAN INDUSTRIAL PARK |
| TAOYUAN SHIEN, TAIWAN 33341 |
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| MUNCY, GEISSLER, OLDS & LOWE, PLLC |
| 4000 LEGATO ROAD |
| SUITE 310 |
| FAIRFAX, VA 22033 |
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