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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
05/07/2013
Application #:
12958420
Filing Dt:
12/02/2010
Publication #:
Pub Dt:
06/07/2012
Inventors:
John Wall, David Jacques, Paul Ryan, Richard Bytheway, David Berman, Matthew Wormington et al
Title:
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
Assignment: 1
Reel/Frame:
025436/0135Recorded: 12/02/2010Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/25/2010
Exec Dt:
11/25/2010
Exec Dt:
11/25/2010
Exec Dt:
11/30/2010
Exec Dt:
11/25/2010
Exec Dt:
11/25/2010
Exec Dt:
11/30/2010
Exec Dt:
11/29/2010
Assignee:
P.O. BOX 103
MIGDAL HAEMEK, ISRAEL 23100
Correspondent:
D. KLIGLER I.P. SERVICES LTD.
P.O. BOX 33111
TEL AVIV, 61330 ISRAEL
Assignment: 2
Reel/Frame:
055994/0565Recorded: 04/13/2021Pages: 9
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/18/2019
Assignee:
6 HAMECHKAR STREET
P.O. BOX 103
MIGDAL HAEMEK, ISRAEL 2306990
Correspondent:
KLIGLER & ASSOCIATES PATENT ATTORNEYS LTD.
P.O. BOX 57651
TEL AVIV, 6157601 ISRAEL

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