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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
13511112
Filing Dt:
05/21/2012
Publication #:
Pub Dt:
12/13/2012
Inventors:
Seok-Kee Hong, Young-Hwan Lim, Si-Eun Yang, Dong Young Jang, Ho-Jin Hwang, Chang-Woo Ban
Title:
INSPECTION DEVICE FOR BONDED WAFER USING LASER
Assignment: 1
Reel/Frame:
028243/0389Recorded: 05/21/2012Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/18/2012
Exec Dt:
05/18/2012
Exec Dt:
05/18/2012
Exec Dt:
05/18/2012
Exec Dt:
05/18/2012
Exec Dt:
05/18/2012
Assignee:
172 GONGNEUNG-DONG, NOWON-GU,
SEOUL, KOREA, REPUBLIC OF 139-240
Correspondent:
JAMES E. BAME
IPLA P.A.
3550 WILSHIRE BLVD. 17TH FLOOR
LOS ANGELES, CA 90010

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