Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13858676
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Filing Dt:
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04/08/2013
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Publication #:
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Pub Dt:
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10/10/2013
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Inventors:
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Isao Yonekura, Tsutomu Murakawa
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Title:
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PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHI-CHO 1-CHOME, NERIMA-KU, |
| TOKYO, 179-0071, JAPAN |
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| 1-5-1, TAITO, TAITO-KU |
| TOKYO, 110-8560, JAPAN |
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| YASUO MURAMATSU |
| MURAMATSU & ASSOCIATES |
| SUITE 310 |
| 114 PACIFICA |
| IRVINE, CA 92618 |
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