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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/03/2015
Application #:
13470863
Filing Dt:
05/14/2012
Publication #:
Pub Dt:
11/14/2013
Inventors:
Rajesh Mittal, Puneet Sabbarwal, Prakash Narayanan, Rubin Ajit Parekhji
Title:
INTEGRATED CIRCUITS CAPABLE OF GENERATING TEST MODE CONTROL SIGNALS FOR SCAN TESTS
Assignment: 1
Reel/Frame:
028203/0856Recorded: 05/14/2012Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/27/2012
Exec Dt:
04/27/2012
Exec Dt:
04/27/2012
Exec Dt:
04/27/2012
Assignee:
12500 TI BOULEVARD, M/S 3999
DALLAS, TEXAS 75243
Correspondent:
TEXAS INSTRUMENTS INCORPORATED
P O BOX 655474, M/S 3999
DALLAS, TX 75265

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