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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/10/2016
Application #:
14010484
Filing Dt:
08/26/2013
Publication #:
Pub Dt:
03/06/2014
Inventors:
Qiang Zhang, Yanwei Liu, Abdurrahman Sezginer
Title:
WAVE FRONT ABERRATION METROLOGY OF OPTICS OF EUV MASK INSPECTION SYSTEM
Assignment: 1
Reel/Frame:
031347/0213Recorded: 10/04/2013Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/27/2013
Exec Dt:
08/27/2013
Exec Dt:
08/27/2013
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
KWAN & OLYNICK LLP
2000 HEARST AVENUE, SUITE 305
BERKELEY, CA 94709

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