Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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01/19/2016
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Application #:
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14373893
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Filing Dt:
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07/22/2014
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Publication #:
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Pub Dt:
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01/01/2015
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Inventors:
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Jan Andries Meijer, Abdourahmane Ange Sarr, Paul IJmert Scheffers
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Title:
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DEVICE FOR SPOT SIZE MEASUREMENT AT WAFER LEVEL USING A KNIFE EDGE AND A METHOD FOR MANUFACTURING SUCH A DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| COMPUTERLAAN 15 |
| DELFT, NETHERLANDS 2628 XK |
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| BLAKELY SOKOLOFF TAYLOR & ZAFMAN, LLP |
| 1279 OAKMEAD PARKWAY |
| SUNNYVALE, CA 94085-4040 |
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Assignment:
2
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COURT APPOINTMENT (SEE DOCUMENT FOR DETAILS).
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| POORTWEG 6C |
| PA DELFT, NETHERLANDS 2612 |
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| FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
| 901 NEW YORK AVENUE NW |
| WASHINGTON, DC 20001 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| DE RUN 6501 |
| DR VELDHOVEN, NETHERLANDS 5504 |
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| FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
| 901 NEW YORK AVENUE NW |
| WASHINGTON, DC 20001 |
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