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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/13/2016
Application #:
14040178
Filing Dt:
09/27/2013
Publication #:
Pub Dt:
04/02/2015
Inventors:
Nilanjan Ghosh, Zhiyong Wang, Shuhong Liu, Yu-Chun Chen
Title:
METROLOGY TOOL FOR ELECTROLESS COPPER THICKNESS MEASUREMENT FOR BBUL PROCESS DEVELOPMENT MONITORING
Assignment: 1
Reel/Frame:
032187/0958Recorded: 02/10/2014Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/08/2013
Exec Dt:
10/08/2013
Exec Dt:
10/08/2013
Exec Dt:
10/08/2013
Assignee:
2200 MISSION COLLEGE BOULEVARD
SANTA CLARA, CALIFORNIA 95054
Correspondent:
BLAKELY SOKOLOFF TAYLOR & ZAFMAN LLP
1279 OAKMEAD PARKWAY
SUNNYVALE, CA 94085-4040

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