Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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14231885
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Filing Dt:
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04/01/2014
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Publication #:
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Pub Dt:
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10/01/2015
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Inventors:
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Jessica Maude TOPPLE, Yoichi MIYAHARA, Peter Heinz GRUTTER, Zeno Schumacher
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Title:
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ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1891 ROBERTSON ROAD, SUITE 500 |
| OTTAWA, CANADA K2H 5B7 |
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| DANIELS IP SERVICES LTD. |
| 555 LEGGET DRIVE |
| SUITE 204 |
| KANATA, K2K 2X3 CANADA |
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