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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
14309566
Filing Dt:
06/19/2014
Publication #:
Pub Dt:
12/24/2015
Inventor:
Francis T. McQUADE
Title:
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
Assignment: 1
Reel/Frame:
038753/0308Recorded: 05/31/2016Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/31/2016
Assignee:
107 MCNUTT ROAD
HUTTO, TEXAS 78634
Correspondent:
RUSSELL NG PLLC
8729 SHOAL CREEK BLVD.
SUITE 100
AUSTIN, TX 78757
Assignment: 2
Reel/Frame:
044632/0080Recorded: 01/16/2018Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/04/2017
Assignee:
46575 FREMONT BLVD.
FREMONT, CALIFORNIA 94538
Correspondent:
JADRAN ADRIAN MIHAILOVIC, PH.D.
CHRISTENSEN O'CONNOR JOHNSON KINDNESS PLLC
1201 THIRD AVENUE, SUITE 3600
SEATTLE, WA 98101-3029

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