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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/28/2017
Application #:
14862410
Filing Dt:
09/23/2015
Publication #:
Pub Dt:
01/14/2016
Inventors:
Wen-Yen Chen, Kuan-Nan Liu
Title:
Method for Overcoming Broken Line and Photoresist Scum Issues in Tri-Layer Photoresist Patterning
Assignment: 1
Reel/Frame:
036633/0540Recorded: 09/23/2015Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/19/2013
Exec Dt:
12/19/2013
Assignee:
NO. 8, LI-HSIN ROAD 6
SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU, TAIWAN 300-77
Correspondent:
HAYNES AND BOONE, LLP IP SECTION
2323 VICTORY AVENUE
SUITE 700
DALLAS, TX 75219
Assignment: 2
Reel/Frame:
040904/0724Recorded: 01/09/2017Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/17/2016
Exec Dt:
02/18/2016
Assignee:
NO. 8, LI-HSIN RD. 6
SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU, TAIWAN 300-77
Correspondent:
HAYNES AND BOONE, LLP IP SECTION
2323 VICTORY AVENUE
SUITE 700
DALLAS, TX 75219

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