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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
9417055
Issue Dt:
08/16/2016
Application #:
14799107
Filing Dt:
07/14/2015
Publication #:
20160061583
Pub Dt:
03/03/2016
Inventors:
Sung-Yoon RYU, Chung-Sam JUN, Ho-Jeong KWAK, Kwan-Woo RYU, Sang-Kil LEE, Woo-Seok KO et al
Title:
APPARATUS FOR MEASURING THICKNESS OF THIN FILM, SYSTEM INCLUDING THE APPARATUS, AND METHOD FOR MEASURING THICKNESS OF THIN FILM
Assignment: 1
Reel/Frame:
036091/0670Recorded: 07/15/2015Pages: 14
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
RYU, SUNG-YOON
Exec Dt:
04/13/2015
LEE, SANG-KIL
Exec Dt:
04/13/2015
JUN, CHUNG-SAM
Exec Dt:
04/13/2015
KO, WOO-SEOK
Exec Dt:
07/07/2015
KWAK, HO-JEONG
Exec Dt:
04/21/2015
KIM, SOUK
Exec Dt:
04/15/2015
RYU, KWAN-WOO
Exec Dt:
04/27/2015
YANG, YU-SIN
Exec Dt:
04/13/2015
Assignee:
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO,
SUWON-SI, KOREA, REPUBLIC OF 443-742
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVE NW SUITE 800
WASHINGTON, DC 20037

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