Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/19/2017
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Application #:
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14834991
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Filing Dt:
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08/25/2015
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Publication #:
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Pub Dt:
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03/03/2016
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Inventors:
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David L. Brown, Yung-Ho Alex Chuang, Venkatraman Iyer, John Fielden, Marcel Trimpl et al
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Title:
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Scanning Electron Microscope And Methods Of Inspecting And Reviewing Samples
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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BEVER, HOFFMAN & HARMS, LLP |
39500 STEVENSON PLACE |
SUITE 209 |
FREMONT, CA 94539 |
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