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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/11/2018
Application #:
14960121
Filing Dt:
12/04/2015
Publication #:
Pub Dt:
06/09/2016
Inventors:
Jiyou Fu, Noam Sapiens, Kevin A. Peterlinz, Stilian Ivanov Pandev
Title:
Methods and systems for Spectroscopic Beam Profile Metrology having a first two dimensional detector to detect collected light transmitted by a first wavelength dispersive element (As amended)
Assignment: 1
Reel/Frame:
037619/0136Recorded: 01/29/2016Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/18/2015
Exec Dt:
12/15/2015
Exec Dt:
01/14/2016
Exec Dt:
01/28/2016
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSEPH S SPANO
851 BURLWAY ROAD, SUITE 407
BURLINGAME, CA 94010

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