Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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14748644
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Filing Dt:
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06/24/2015
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Publication #:
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Pub Dt:
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09/29/2016
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Inventors:
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Mingxing Wang, Wenfei Fan, Xibei Jia
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Title:
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DATA QUALITY MEASUREMENT METHOD BASED ON A SCATTER PLOT
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Assignment:
1
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CORRECTIVE ASSIGNMENT TO CORRECT THE THE FIRST ASSIGNOR'S EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 035911 FRAME: 0658. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| ROOM 713, 715, 716, FLOOR 7, SOFTWARE BUILDING, NO. 9, HIGHTECH MIDDLE 1 ROAD, HIGH-TECH ZONE MIDDLE NANSHAN DISTRICT |
| SHENZHEN, CHINA 518057 |
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| DICKE, BILLIG & CZAJA |
| 100 SOUTH FIFTH STREET |
| SUITE 2250 |
| MINNEAPOLIS, MN 55402 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ROOM 713, 715, 716, FLOOR 7, SOFTWARE BUILDING, NO. 9, HIGHTECH MIDDLE 1 ROAD, HIGH-TECH ZONE MIDDLE NANSHAN DISTRICT |
| SHENZHEN, CHINA 518057 |
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| DICKE, BILLIG & CZAJA |
| 100 SOUTH FIFTH STREET |
| SUITE 2250 |
| MINNEAPOLIS, MN 55402 |
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