Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/29/2019
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Application #:
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15255658
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Filing Dt:
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09/02/2016
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Publication #:
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Pub Dt:
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03/09/2017
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Inventors:
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Kazuhiko INOUE, Riki OGAWA
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Title:
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METHOD FOR MEASURING PATTERN WIDTH DEVIATION, AND PATTERN INSPECTION APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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8-1, SHINSUGITA-CHO, ISOGO-KU |
YOKOHAMA-SHI, KANAGAWA, JAPAN 235-8522 |
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OBLON, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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