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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
10436723
Issue Dt:
10/08/2019
Application #:
15312881
Filing Dt:
11/21/2016
Publication #:
20170191950
Pub Dt:
07/06/2017
Inventors:
Takeshi OSAKABE, Tetsuya OZAWA, Kazuhiko OMOTE, Licai JIANG, Boris VERMAN, Yuriy PLATONOV
Title:
X-RAY DIFFRACTOMETER WITH MULTILAYER REFLECTION-TYPE MONOCHROMATOR
Assignment: 1
Reel/Frame:
040393/0914Recorded: 11/21/2016Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
OSAKABE, TAKESHI
Exec Dt:
09/29/2016
OZAWA, TETSUYA
Exec Dt:
09/27/2016
OMOTE, KAZUHIKO
Exec Dt:
09/27/2016
JIANG, LICAI
Exec Dt:
09/20/2016
VERMAN, BORIS
Exec Dt:
09/20/2016
PLATONOV, YURIY
Exec Dt:
09/20/2016
Assignee:
RIGAKU CORPORATION
3-9-12, MATSUBARA-CHO
AKISHIMA-SHI, TOKYO, JAPAN 196-8666
Correspondent:
WESTERN, HATTORI, DANIELS & ADRIAN LLP
1250 CONNECTICUT AVE NW, SUITE 700
WASHINGTON, DC 20036

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