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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/10/2018
Application #:
15473879
Filing Dt:
03/30/2017
Publication #:
Pub Dt:
07/20/2017
Inventors:
Murat BOZKURT, Martin Jacobus Johan JAK, Patricius Aloysius Jacobus TINNEMANS
Title:
Method of Measuring a Property of a Target Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
Assignment: 1
Reel/Frame:
041800/0770Recorded: 03/30/2017Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/24/2014
Exec Dt:
09/24/2014
Exec Dt:
09/25/2014
Assignee:
DE RUN 6501
VELDHOVEN, NETHERLANDS NL - 5504 DR
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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