Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/28/2019
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Application #:
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15641150
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Filing Dt:
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07/03/2017
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Publication #:
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Pub Dt:
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10/26/2017
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Inventors:
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Rui-fang Shi, Abdurrahman Sezginer
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Title:
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APPARATUS AND METHODS FOR PREDICTING WAFER-LEVEL DEFECT PRINTABILITY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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KWAN & OLYNICK LLP |
2000 HEARST AVENUE |
SUITE 305 |
BERKELEY, CA 94709 |
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