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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
05/07/2019
Application #:
15364470
Filing Dt:
11/30/2016
Publication #:
Pub Dt:
05/31/2018
Inventors:
FRANCIS T. MCQUADE, RAUL RAMON MOLINA IV, MICHAEL CHRASTECKY
Title:
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
Assignment: 1
Reel/Frame:
047530/0326Recorded: 11/16/2018Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/07/2016
Exec Dt:
09/07/2016
Exec Dt:
09/07/2016
Assignee:
107 MCNUTT ROAD
HUTTO, TEXAS 78634
Correspondent:
RUSSELL NG PLLC
8729 SHOAL CREEK BLVD., SUITE 100
AUSTIN, TX 78757
Assignment: 2
Reel/Frame:
047530/0889Recorded: 11/16/2018Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/01/2018
Assignee:
46575 FREMONT BOULEVAR
FREMONT, CALIFORNIA 94538
Correspondent:
RUSSELL NG PLLC
8729 SHOAL CREEK BLVD., SUITE 100
AUSTIN, TX 78757

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