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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/08/2020
Application #:
15813553
Filing Dt:
11/15/2017
Publication #:
Pub Dt:
09/13/2018
Inventors:
Hung-Sen KUO, Te-Wei CHEN, Hung-Sheng CHANG, Ming-Wan KUAN
Title:
TEST METHODS FOR PACKAGED INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
044134/0629Recorded: 11/15/2017Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/26/2017
Exec Dt:
09/26/2017
Exec Dt:
09/26/2017
Exec Dt:
09/26/2017
Assignee:
8F-1, NO.36, TAIYUAN ST.
JHUBEI CITY, HSINCHU COUNTY, TAIWAN 302
Correspondent:
MCCLURE, QUALEY & RODACK, LLP
3100 INTERSTATE NORTH CIRCLE
SUITE 150
ATLANTA, GA 30339

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