Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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15974595
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Filing Dt:
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05/08/2018
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Publication #:
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Pub Dt:
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11/08/2018
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Inventors:
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Alvise Memo, David Demirdjian, Giulio Marin, Kinh Tieu, Francesco Peruch et al
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Title:
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SYSTEMS AND METHODS FOR INSPECTION AND DEFECT DETECTION USING 3-D SCANNING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2225 E. BAYSHORE RD. |
| STE 110 |
| PALO ALTO, CALIFORNIA 94303 |
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| LEWIS ROCA ROTHGERBER CHRISTIE LLP |
| PO BOX 29001 |
| GLENDALE, CA 91209 |
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