Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/13/2021
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Application #:
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16157737
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Filing Dt:
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10/11/2018
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Publication #:
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Pub Dt:
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02/07/2019
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Inventors:
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Alexander William STRONG, Daryoosh SAEEDKIA, Roberto BRAVO
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Title:
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METHODS AND SYSTEMS FOR THICKNESS MEASUREMENT OF MULTI-LAYER STRUCTURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 170 COLUMBIA STREET WEST, |
| SUITE 3 |
| WATERLOO, CANADA N2L 3L3 |
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| BERESKIN & PARR LLP/S.E.N.C.R.L.S.R.L. |
| 40 KING STREET WEST, 40TH FLOOR |
| TORONTO, M5H 3Y2 CANADA |
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