Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/19/2020
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Application #:
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16222270
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Filing Dt:
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12/17/2018
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Publication #:
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Pub Dt:
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06/27/2019
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Inventors:
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Riki OGAWA, Hiroyuki NAGAHAMA
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Title:
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DISPLACEMENT MEASURING APPARATUS, ELECTRON BEAM INSPECTION APPARATUS, AND DISPLACEMENT MEASURING METHOD
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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8-1, SHINSUGITA-CHO, ISOGO-KU |
YOKOHAMA-SHI, KANAGAWA, JAPAN 235-8522 |
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OBLON, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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05/21/2024 09:13 AM
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