Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/09/2021
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Application #:
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16072657
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Filing Dt:
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07/25/2018
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Publication #:
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Pub Dt:
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08/15/2019
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Inventors:
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Choon Hoong Hoo, Fangren Ji, Amnon Manassen, Liran Yerushalmi, Antonio Mani, Allen Park et al
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Title:
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Measurement of Overlay Error Using Device Inspection System
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DR. |
| MILPITAS, CALIFORNIA 95035 |
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| HODGSON RUSS LLP |
| THE GUARANTY BUILDING |
| 140 PEARL STREET, SUITE 100 |
| BUFFALO, NY 14202-4040 |
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