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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/21/2021
Application #:
16378049
Filing Dt:
04/08/2019
Publication #:
Pub Dt:
08/22/2019
Inventors:
Randolph E. Griffith, Scott Pozzi-Loyola, Steve Scranton, John B. Putman, Jeff Andresen et al
Title:
SYSTEMS, DEVICES, AND METHODS FOR COMBINED WAFER AND PHOTOMASK INSPECTION
Assignment: 1
Reel/Frame:
056383/0788Recorded: 05/28/2021Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/05/2018
Exec Dt:
06/05/2018
Exec Dt:
06/06/2018
Exec Dt:
06/05/2018
Exec Dt:
06/08/2018
Exec Dt:
02/07/2019
Exec Dt:
02/08/2019
Assignee:
2251 FRONT STREET
SUITE 110
CUYAHOGA FALLS, OHIO 44223
Correspondent:
DLA PIPER LLP (US)
11911 FREEDOM DRIVE
SUITE 300
RESTON, VA 20190
Assignment: 2
Reel/Frame:
065726/0001Recorded: 11/30/2023Pages: 80
Conveyance:
SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/30/2023
Exec Dt:
11/30/2023
Exec Dt:
11/30/2023
Assignee:
601 LEXINGTON AVENUE 54TH FLOOR
NEW YORK, NEW YORK 10022
Correspondent:
STEWART WALSH
1025 CONNECTICUT AVE NW, SUITE 712
COGENCY GLOBAL INC.
WASHINGTON, DC 20036

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