Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/20/2021
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Application #:
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16360788
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Filing Dt:
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03/21/2019
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Publication #:
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Pub Dt:
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09/26/2019
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Inventors:
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Chau-Jern CHENG, Han-Yen TU, Kuang-Che CHANG CHIEN, Yu-Chih Lin
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Title:
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COMPLEX DEFECT DIFFRACTION MODEL AND METHOD FOR DEFECT INSPECTION OF TRANSPARENT SUBSTRATE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 162, SEC. 1, HEPING R. RD., |
| DA'AN DIST. |
| TAIPEI CITY, TAIWAN 106 |
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| MUNCY, GEISSLER, OLDS & LOWE, PC |
| 4000 LEGATO RD., SUITE 310 |
| FAIRFAX, VA 22033 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED AT REEL: 048725 FRAME: 0928. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| NO.162, SEC. 1, HEPING E. RD., DA'AN DIST. |
| TAIPEI CITY, TAIWAN 106 |
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| MUNCY, GEISSLER, OLDS & LOWE, PC |
| 4000 LEGATO RD., SUITE 310 |
| FAIRFAX, VA 22033 |
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