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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
10/08/2024
Application #:
16424811
Filing Dt:
05/29/2019
Publication #:
Pub Dt:
12/12/2019
Inventors:
Lorenzo Tripodi, Patrick Warnaar, Grzegorz Grzela, Scott Anderson Middlebrooks et al
Title:
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate
Assignment: 1
Reel/Frame:
055000/0866Recorded: 01/22/2021Pages: 12
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/29/2018
Exec Dt:
12/05/2018
Exec Dt:
02/27/2019
Exec Dt:
08/24/2018
Exec Dt:
12/03/2018
Exec Dt:
09/09/2018
Exec Dt:
08/24/2018
Exec Dt:
12/06/2018
Exec Dt:
08/24/2018
Assignee:
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005
Assignment: 2
Reel/Frame:
055001/0159Recorded: 01/22/2021Pages: 12
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/10/2018
Exec Dt:
11/27/2018
Exec Dt:
11/27/2018
Exec Dt:
12/10/2018
Exec Dt:
02/14/2019
Exec Dt:
12/10/2018
Exec Dt:
02/18/2019
Exec Dt:
11/19/2018
Exec Dt:
12/16/2018
Exec Dt:
11/20/2018
Assignee:
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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