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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/21/2023
Application #:
16691029
Filing Dt:
11/21/2019
Publication #:
Pub Dt:
05/28/2020
Inventors:
Keon LEE, Min-Ji PARK, Yun-Ho CHOI, Yeon-Ho KIM, Ji-Hoon LIM, Jae-Hyuck WOO
Title:
INTEGRATED CIRCUIT TEST APPARATUS
Assignment: 1
Reel/Frame:
055313/0826Recorded: 02/18/2021Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/19/2019
Exec Dt:
11/19/2019
Exec Dt:
11/19/2019
Exec Dt:
11/19/2019
Exec Dt:
11/19/2019
Exec Dt:
11/19/2019
Assignee:
12, TEHERAN-RO 113-GIL, GANGNAM-GU
SEOUL, KOREA, REPUBLIC OF 06171
Correspondent:
BRINKS GILSON & LIONE
455 N. CITYFRONT PLAZA DRIVE
SUITE 3600
CHICAGO, IL 60611
Assignment: 2
Reel/Frame:
055559/0928Recorded: 03/11/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/09/2021
Assignee:
203, TEHERAN-RO, GANGNAM-GU
SEOUL, KOREA, REPUBLIC OF 06141
Correspondent:
BRINKS GILSON & LIONE
455 N. CITYFRONT PLAZA DRIVE
SUITE 3600
CHICAGO, IL 60611

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