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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
11302544
Issue Dt:
04/12/2022
Application #:
16467968
Filing Dt:
06/08/2019
Publication #:
20200312687
Pub Dt:
10/01/2020
Inventors:
Roie Volkovich, Renan Milo, Liran Yerushalmi, Moran Zaberchik, Yoel Feler, David Izraeli
Title:
METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN
Assignment: 1
Reel/Frame:
049591/0138Recorded: 06/26/2019Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
VOLKOVICH, ROIE
Exec Dt:
05/19/2019
MILO, RENAN
Exec Dt:
06/19/2019
YERUSHALMI, LIRAN
Exec Dt:
05/16/2019
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DR.
MILPITAS, CALIFORNIA 95035
Correspondent:
HODGSON RUSS LLP
140 PEARL STREET
SUITE 100
BUFFALO, NY 14202-4040
Assignment: 2
Reel/Frame:
049591/0224Recorded: 06/26/2019Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
ZABERCHIK, MORAN
Exec Dt:
06/23/2019
FELER, YOEL
Exec Dt:
05/19/2019
IZRAELI, DAVID
Exec Dt:
06/13/2019
Assignee:
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DR.
MILPITAS, CALIFORNIA 95035
Correspondent:
HODGSON RUSS LLP
140 PEARL STREET
SUITE 100
BUFFALO, NY 14202

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